李佳乐,张颖,王海锋,陈旭,刘亚男.不同抛光系统对大块充填树脂表面粗糙度和形貌的影响[J].口腔材料器械杂志,2025,34(3):142-146.
不同抛光系统对大块充填树脂表面粗糙度和形貌的影响
Effect of different polishing systems on surface roughness and morphology of bulk-fill resin composites
投稿时间:2024-09-03  修订日期:2025-03-06
DOI:10.11752/j.kqcl.2025.03.03
中文关键词:  大块充填树脂  抛光  表面粗糙度  扫描电子显微镜
英文关键词:Bulk fill composite resins  Polishing  Surface roughness  Scanning electron microscope
基金项目:中国康复研究中心青年基金课题(2023ZX-Q17)
作者单位E-mail
李佳乐 北京市东城区崇文口腔医院儿童口腔科, 北京, 100062  
张颖 北京市东城区崇文口腔医院儿童口腔科, 北京, 100062  
王海锋 首都医科大学康复医学院, 中国康复研究中心, 北京博爱医院口腔科, 北京 100068  
陈旭 首都医科大学康复医学院, 中国康复研究中心, 北京博爱医院口腔科, 北京 100068  
刘亚男 首都医科大学康复医学院, 中国康复研究中心, 北京博爱医院口腔科, 北京 100068 lyndentist@163.com 
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中文摘要:
      目的 研究不同抛光系统对大块充填树脂表面粗糙度和形貌的影响,为临床选择适宜的抛光工具提供依据。方法 将 3 种大块充填树脂 Filtek Bulk Fill Posterior Restorative(FBF 组),Tetric N-Ceram Bulk Fill(TEBF 组),X-tra fil(XTF 组)各制作 24个试件,每种树脂材料随机分为 4组,每组 6个试件,分别用3M Sof-LexTM Discs(3M组)、EVE RA341复合材料抛光套装(Eve组)、OptraGloss® Composite Kit (Ivo组)和道邦RA0312D复合树脂抛光套装(Tob组)进行抛光。测量每组试件抛光后的表面粗糙度Ra,扫描电子显微镜(SEM)观察试件表面形貌。结果 3种大块树脂同种材料组内Ra值结果为3M组(0.211±0.064)mm和Eve组(0.206±0.054)mm 低于 Ivo组(0.293±0.090)mm 和 Tob组(0.302±0.084)mm,差异具有统计学意义(P<0.05),而3M组和Eve组、Ivo组和Tob组组间差异无统计学意义(P>0.05)。不同大块树脂间Ra值TEBF组(0.231±0.057)mm和FBF组(0.187±0.036)mm低于XTF组(0.341±0.070)mm,差异有统计学意义(P<0.05)。SEM观察结果与粗糙度值的统计结果一致。结论 大块充填树脂材料表面粗糙度值受抛光系统类型和不同材料的影响。FBF组树脂获得最低表面粗糙度,使用3M和Eve抛光各种大块充填树脂均可获得较好的抛光效果。
英文摘要:
      Objective To investigate the effects of different polishing systems on the surface roughness and morphology of bulk-fill composite resin, providing a basis for clinicians to select appropriate polishing tools. Methods Three bulk-fill composite resins, FBF (Filtek Bulk Fill Posterior Restorative), TEBF (Tetric N-Ceram Bulk Fill), and XTF (X-tra fil) were used. Twenty-four specimens of each material were randomLy divided into four groups (n = 6), with each group polished using one of the following systems: 3M Sof-Lex Discs (3M), EVE RA341 kit (Eve), OptraGloss® Composite Kit (Ivo), or TobooM RA0312D kit (Tob). The surface roughness (Ra) was measured for each group of specimens after polishing, and their morphology was observed using scanning electron microscopy (SEM). Results Within the same material group, 3M (0.211±0.064 mm) and Eve (0.206± 0.054 mm) groups had significantly lower Ra values than Ivo (0.293±0.090 mm) and Tob (0.302±0.084 mm) groups, with statistically significant differences (P < 0.05); however, no significant difference was found between 3M and Eve or Ivo and Tob (P > 0.05). Among different materials, FBF (0.187 ± 0.036 mm) and TEBF (0.231 ± 0.057 mm) showed lower Ra values than XTF (0.341 ± 0.070 mm), with statistically significant differences (P < 0.05). SEM findings were consistent with surface roughness measurements. Conclusion Both the polishing system and resin material significantly influence the surface roughness and morphology of bulk-fill composites. FBF achieved the lowest surface roughness, and 3M and Eve polishing systems can be used to achieve optimal polishing results on all types of bulk fill composite resins.
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